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► Edge contour
► Edge analysis
► Surface
and Sub-surface
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Nano InSPEC™ edge and surface
inspection systems are non-contact diagnostic tools ideal for
nanotechnology, ultra-precision engineering, nano manufacturing, and
nanometer-CD fabrication processes.
Nano InSPEC scanning probe nanoscopes are utilized worldwide for the
following applications:
Nano InSPEC is available configured for various
applications:
VeriEdge™ : comprehensive
nanometer edge analysis
AQEdge™ : nanometer edge image and edge contour metrology
CircTrak™ : circumferential edge metrology of a flat disk or an aperture
LinEdge™ : rapid knife edge scanner for edge variation and defect detection
NanoScat™ : nanometer
resolution surface, sub-surface, and defect analysis
Nano InSPEC nano-precision imaging systems are utilized
in industry for the metrology of defects, edges, surfaces, and sub-surface
structure.
Nano InSPEC systems
are engineered for a simple one-step initialization of the scanning probe to a
target. The system scans rapidly, and
within minutes provides information critical to process optimization.
Nano InSPEC technology is
designed for plug-and-play assembly, and seamless integration within any
industrial or R&D environment.
Several software and hardware options are available with each unit to
enhance performance.
Edge
and Surface Metrology Services
utilizing our Nano InSPEC systems are provided for nominal fees.
Hard disk magnetic read-write head
measurements
Please
feel free to contact us about your specific application, for current and complete
information on various Nano InSPEC™ models, or any associated services.
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