Nano InSPEC Edge and Surface Metrology Systems

  Edge contour
  Edge analysis
 Surface and Sub-surface 
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Nano InSPEC™ edge and surface inspection systems are non-contact diagnostic tools ideal for nanotechnology, ultra-precision engineering, nano manufacturing, and nanometer-CD fabrication processes.  Nano InSPEC scanning probe nanoscopes are utilized worldwide for the following applications:


Nano InSPEC  is available configured for various applications:

VeriEdge™ :   comprehensive nanometer edge analysis

AQEdge™ :    nanometer edge image and edge contour metrology

CircTrak™ :    circumferential edge metrology of a flat disk or an aperture

LinEdge™ :    rapid knife edge scanner for edge variation and defect detection

NanoScat™ :  nanometer resolution surface, sub-surface, and defect analysis

 

 

Nano InSPEC  nano-precision imaging systems are utilized in industry for the metrology of defects, edges, surfaces, and sub-surface structure.

Nano InSPEC systems are engineered for a simple one-step initialization of the scanning probe to a target.  The system scans rapidly, and within minutes provides information critical to process optimization. 

Nano InSPEC technology is designed for plug-and-play assembly, and seamless integration within any industrial or R&D environment.  Several software and hardware options are available with each unit to enhance performance. 

 

 

Edge and Surface Metrology Services  utilizing our Nano InSPEC systems are provided for nominal fees.

Hard disk magnetic read-write head measurements

Please feel free to  contact  us about your specific application, for current and complete information on  various Nano InSPEC™ models,  or any associated services. 


 

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